fig3

Figure 3. Microstructure characterization of Ti₂CT_X and Ti₂CT_X/Si₃N₄ aerogel. (A) Image of Ti₂CT_X/Si₃N₄ sample; (B) SEM image of pure Ti₂CT_X; (C) SEM image of Ti₂CT_x/Si₃N₄; (D) Cross-sectional SEM image of Ti₂CT_X/Si₃N₄; (E) SEM image of Ti₂CT_X; (F) SEM image of Ti₂CT_X/Si₃N₄; (G-N) EDS maps of Ti₂CT_X/Si₃N₄. SEM: Scanning electron microscope; EDS: energy dispersive X-ray spectroscopy; HAADF: high-angle annular dark-field.