fig2

Figure 2. (A) Typical SEM image of MXene flakes. Inset is a photograph of MXene ink dispersed in a mixed solution of water; (B) AFM image of Ti₃C₂T_x flakes. Inset is the corresponding height profile along the crossed lines; (C) TEM image of MXene flakes; (D) Histogram of lateral dimensions of Ti₃C₂T_x flakes; (E) SEM images of spray-coated Ti₃C₂T_x MXene film; (F) SEM images of Ti₃C₂T_x MXene films before and after acid etching; (G) EDS mapping of MXene flakes; (H) XRD patterns, (I) Raman spectra, and (J) XPS Ti 2p spectra of Ti₃C₂T_x MXene films before and after acid etching; (K) photograph and (L) partial enlarged SEM image of a laser-patterned MXene electrode. SEM: Scanning electron microscopy; AFM: atomic force microscopy; TEM: transmission electron microscopy; EDS: energy-dispersive X-ray spectrometry; XRD: X-ray diffraction; XPS: X-ray photoelectron spectrometry.