fig5

Figure 5. Bias values at each atomic position near a 10 nm void obtained using (A) SEAKMC and (B) the dipole tensor method. The volumetric strain field corresponding to the same section as (A and B) is shown in (C), where compressive regions correspond to the negative bias regions identified by SEAKMC. A 3D representation of the strain field is provided in (D) for reference, with the section plane corresponding to Figure 4 and (A-C) labeled.