fig11

Figure 11. TEM investigations of BYNTO-YBCO films. (A) Cross-section view. The left half panel: an overview of the HAADF-STEM; the right half panel: a high-resolution HAADF STEM image. (B) Cross-section view: the HAADF STEM image shows the mapped area as well as the elemental Y, Ba, Cu, Ta, and Nb EDX maps. (C) Plan view. The left and center panels are HAADF and LAADF STEM Z-contrast images, and the right is GPA maps. (D) Top panel: an overview of ABF STEM. Bottom panel: High-resolution HAADF STEM image. (E) ADF STEM image showing the strain as brighter contrast features around the short Y124 intergrowths (blue arrows) and BYNTO nanocolumn^[119] © ENEA Frascati Research Centre. Printed in the UK.