fig1

Figure 1. (A1) XRD patterns obtained at room temperature for the PLSBZST thick-film ceramics; (A2) Magnified XRD patterns for 2θ ranging from 42° to 46°; and Rietveld refinements for (Pb_0.92-xLa_0.04Sr_xBa_0.02)(Zr_0.64Sn_0.35Ti_0.01)O₃ thick-film ceramics with different x values: (B) x = 0.04, (C) x = 0.06, (D) x = 0.08, (E) x = 0.10. XRD: X-ray diffraction; PLSBZST: (Pb_0.92-xLa_0.04Sr_xBa_0.02)(Zr_0.64Sn_0.35Ti_0.01)O₃.