fig2

Effect of trace rare earth La on the thermal stability of oxygen-free copper

Figure 2. IPF map, grain boundary distribution, grain size statistics and macroscopic morphology of orange peel defect after annealing at 900 °C for 30 min: (A1-A3) 6N Cu, (B1-B3) La11, (C1-C3) La31, (D1-D3) La180, (E1-E3) La330, (F1) 6N Cu, (F2) La330.

Microstructures
ISSN 2770-2995 (Online)

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