fig17

Figure 17. The TEM characterization of grain boundary segregation in La330 after annealing at 900 °C for 30 min: (A), (I and O)TEM bright-field images, (B-D) EDS elemental map in (A), (J-L) EDS elemental map in (I), (P-R) EDS elemental map in (O), (M and N) EDS line scan, (E and F) HRTEM images and FFT of Phase 1, (G and H) HRTEM images and FFT of Phase 2, (S and T) HRTEM images and FFT of Phase 3.