fig16

Figure 16. TEM characterization of second phase in La330 after annealing at 900 °C for 30 min: (A) TEM bright-field images of second phase in La330, (B) EDS elemental map in (A), (C and D) HRTEM images and FFT of Area 1, (E) TEM bright-field images in Area 2, (F and G) HRTEM images and FFT of Area 3, (H) TEM bright-field images of second phase in La330, (I-K) EDS elemental map in (H), (L) electron diffraction pattern of La₂O₃ of Area 4, (M) Spectra from Point 1, (N) Spectra from Point 2.