fig13
Figure 13. The TEM characterization results of La180 after annealing at 900 °C for 30 min: (A and B) and (D-F)Twins, (C) electron diffraction pattern of (B).
Microstructures
ISSN 2770-2995 (Online)
Navigation
Navigation
Committee on Publication Ethics
https://members.publicationethics.org/members/microstructures
Portico
All published articles are preserved here permanently:
https://www.portico.org/publishers/oae/
