fig1

Fast three-dimensional nanoimaging of electron-beam-sensitive metal-organic frameworks-encapsulated materials

Figure 1. Pre-calibration fast ET acquisition method. (A) 3D ET scheme; (B) Workflow of pre-calibration fast ET series acquisition; (C) Comparison of conventional and pre-calibration acquisition in sample damage, with significant deformation regions clearly marked by white arrows and dashed borders; (D) Comparison of inaccurate reconstruction in conventional acquisition methods with accurate reconstruction in fast acquisition methods. ET: Electron tomography.

Microstructures
ISSN 2770-2995 (Online)

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