fig8
Figure 8. TEM analysis of UIT-(CoCrNi)94(TiAl)6 MEAs. (A and D) Bright field; (B and E) HAADF; (C and F) elements mapping results of Co, Cr, Ni, Ti, Al and O; (G) SAED of nanoprecipitates and crystal structural model; (H and I) Bright field; (J) IFFT. FCC: SF: stacking fault; TEM: transmission electron microscope; UIT: ultrasonic impact treatment; MEA: medium-entropy alloy; HAADF: high-angle annular dark-field; SAED: selected area electron diffraction; IFFT: inverse fast Fourier transform.
