fig6

Figure 6. Deformation substructures of the HS-HEA at 49% strain. ECC images of HS-HEA showing (A) martensite emission from LAGBs, (B) ε-ε intersection in the non-recrystallized and (C) martensite in the recrystallized zone; (D) BF-TEM showing the dual-nanograins of the FCC and HCP phases at the junction area of the HCP lamellae. The selected area electron diffraction pattern confirms the formation of dual-nanograins. Stacking faults are detected inside nanograins; (E and F) Zoom-in HR-TEM images showing ε variants of the marked zone in (D); (G-J) The FFT-filtered HR-TEM images of ε and γ variants in (D). ε_(1-5) and γ_(1-3) represent HCP and FCC variants with different orientations, respectively, of which the specific orientation among them is marked in images. HS: Heterogeneous structure; HEA: high-entropy alloy; ECC: electron channeling contrast; LAGBs: low-angle grain boundaries; BF: bright field; FCC: face-centered cubic; HCP: hexagonal close-packed; HR: high-resolution; FFT: fast Fourier transform.