fig6

Figure 6. (A) Contour plots of the variation of P_r value with crystal radius and doping amount^[44]. Reprinted figures with permission from Ref.^[44] Copyright by IOP Publishing, Ltd. (B) P-V curve and C-V curve^[46]. Reprinted from^[46], with permission from AIP Publishing. (C) Piezoelectric measurement and P-V curve of 70 nm Y:HfO₂ capacitor^[47]. Reprinted from^[47], with permission from AIP Publishing. (D) P-E loops for Y:HfO₂ films with a thickness of 930 nm^[48]. (E) Thickness dependence of P_r for doping HfO₂-based films^[48]. Reprinted from^[48], with permission from AIP Publishing. (F) Typical P-V loops of Y:HfO₂ films measured from 20 to 300 K^[49]. Reprinted from Ref.^[49], with permission from Springer Nature.