fig12

Figure 12. (A) XRD images and ferroelectric loops of HZO films grown on different bottom electrodes^[118]. Reprinted from Ref.^[118], with permission from the Royal Society of Chemistry. (B) Substitution of Mn by Hf/Zr in the interface between LSMO and HZO^[117]. Reprinted figures with permission from Ref.^[117] Copyright by the American Physical Society. (C) The work functions of o-HZO, MnO₂-LSMO, LaSrO-LSMO, and LAO-LSMO^[119]. Reprinted from Ref.^[119], with permission from Springer Nature. (D) Intensity of the o-HZO(111) and m-HZO(002) peaks, (E) P_r as a function of the lattice parameter of the substrate^[63]. Reprinted (adapted) with permission from Ref.^[63]. Copyright (2019) American Chemical Society. Dependence of P_r and V_c on (F) temperature, (G) pressure, and (H) thickness^[120]. Reprinted (adapted) with permission from Ref.^[120]. Copyright (2019) American Chemical Society.