fig1

Figure 1. (A) XRD patterns of Hf_0.84Ta_0.16Fe_2-xCr_x (0 ≤ x ≤ 0.25) at room temperature; (B) Rietveld refinement plots of SXRD at room temperature for Hf_0.84Ta_0.16Fe₂. Red points and black lines represent observed and calculated profiles, respectively, and the difference between them is shown at the bottom of the graph; (C) Crystal structure (left) and Kagome layer on (001) plane (right) of Hf_0.84Ta_0.16Fe₂; (D) Linear thermal expansion (ΔL/L₀) curves of Hf_0.84Ta_0.16Fe_2-xCr_x (0 ≤ x ≤ 0.25). XRD: X-ray diffraction; SXRD: synchrotron X-ray diffraction.