fig1

Figure 1. Synthesis and characterization of BaZrO₃ (~30 nm)/SrCuO₂ (~40 nm) bilayer thin films grown on SrTiO₃ (001) substrates. (A) Schematic of epitaxial growth of BaZrO₃/SrCuO₂ bilayer thin films on SrTiO₃ (001) substrates. (B) Synchrotron XRD θ-2θ scan of BaZrO₃/SrCuO₂ bilayer thin films, and optical image of bilayer sample (inset). (C and D) Rocking-curve measurements of the BaZrO₃ (002) and SrCuO₂ (002) peaks with the FWHM values of ~0.08° and ~0.06°, respectively. (E) RSMs of BaZrO₃/SrCuO₂ bilayer thin films around the (-103) Bragg peaks of SrTiO₃ (001) substrates. (F) The AFM topography images of epitaxial BaZrO₃/SrCuO₂ bilayer thin films grown on SrTiO₃ (001) substrates with surface roughness (rms) of ~1.17 nm.