fig14

Figure 14. (A) Schottky barriers (left axis) and oxygen-vacancy energy (right axis) plotted as a function of Sm doping content x, and absorption coefficients for (Bi,Sm)FeO₃ thin films. Reproduced with permission^[96]. Copyright 2023, American Chemical Society; (B) Quantitative analysis of Mn and O displacement and bond angles within an SMO film. (C) Polarization and polar rotation of the SMO structure. Flexoelectricity induced gradual rotation of the in-plane polarization (P_s). (B and C) Reproduced with permission^[28]. Copyright 2016, American Chemical Society; (D) Schematic of the in-situ potential scanning geometry measurement system and the structure of the multilayer oxide films. (E) Schematic and surface potential profile of the band across the Nb:SrTiO₃/SrTiO₃ interface. (F) Schematic of PLD-induced substrate reduction and reoxidation. (D-F) Reproduced with permission^[100]. Copyright 2019, American Association for the Advancement of Science. SMO: SrMnO₃; PLD: pulsed laser deposition; YSZ: yttria-stabilized zirconia; STO: SrTiO₃.