fig4

Figure 4. (A-I) Cs-STEM analysis; HRTEM images and thin film FFT patterns of (A and B) TZ and (C and D) TZ-NL powders, (E-H) EDS mapping, and (I) HAADF-STEM image of TZ; (J) XRD spectra. Cs-STEM: Cs-corrected scanning transmission electron microscopy; FFT: fast Fourier transform; EDS: energy-dispersive X-ray spectroscopy; XRD: X-ray diffraction; BTS: Bi₂Te₃Se_0.3; HRTEM: high-resolution transmission electron microscopy; TZ-NL: TiO₂/ZnO nanolaminate; HAADF-STEM: high-angle annular dark-field scanning transmission electron microscopy.