fig3

Interface-engineered Bi<sub>2</sub>Te<sub>3</sub> powders via atomic layer deposited TiO<sub>2</sub>-ZnO multilayer for improved thermoelectric performance

Figure 3. XPS spectra of (A) Ti 2p, (B) Zn 2p, (C) O 1s, (D) Bi 4f, (E) Te 3d, and (F) Se 3d. XPS: X-ray photoelectron spectroscopy; BTS: Bi2Te3Se0.3; TZ-NL: TiO2/ZnO nanolaminate.

Microstructures
ISSN 2770-2995 (Online)

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/