fig3
Figure 3. Surface Seebeck map of (A) Mg1.95Si0.3Sn0.7 and (B) Mg1.95Si0.233Sn0.7Sb0.067, respectively, measured by the Seebeck microprobe. The scaling of the spot structure where S is outside the matrix range is the same as the Si-rich inclusions visible in the SEM micrographs. SEM: Scanning electron microscopy.
