fig8

Figure 8. SEM images of (A-C) G-15% nSi electrode at (A) the fresh state, (B) after 20 cycles, (C) after 100 cycles, and of (D-F) G-15% nSi-CNT electrode (D) at the fresh state, (E) after 20 cycles, and (F) after 100 cycles. Insets are FIB-SEM cross-section images of their corresponding electrodes. Yellow dashed circled areas correspond to nSi regions of interest. SEM: Scanning electron microscope; nSi: nano-silicon; CNT: carbon nanotube; FIB: focused ion beam.