fig3

Atomically dispersed noble-metal-sensitized semiconductor metal oxides for chemiresistive gas sensing

Figure 3. Structural characterization of atomically dispersed Pd on TiO2 using electron microscopy and synchrotron-based spectroscopy. (A) TEM; (B) HAADF-STEM; and (C) elemental mapping images of Pd1-TiO2; (D) XANES and (E) k2-weighted EXAFS spectra at the Pd K-edge of Pd1-TiO2, PdO, and Pd foil. (F) The corresponding fit of the EXAFS spectrum of Pd1-TiO2 at the R space. The inset shows the local structure of the atomically dispersed Pd on TiO2 The wavelet transform of the experimental EXAFS spectra of (G) Pd1-TiO2; (H) PdO; and (I) Pd foil. Reproduced with permission from Ref.[9]. Copyright 2021, American Chemical Society. TEM: Transmission electron microscopy; HAADF-STEM: high-angle annular dark-field scanning transmission electron microscopy; XANES: X-ray absorption near-edge structure; EXAFS: X-ray absorption fine structure; FT: Fourier Transform.