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fig13

From:  Exploring the underlying mechanisms of ferroelectric behavior in metal-doped aluminum nitride: an in-depth review
Exploring the underlying mechanisms of ferroelectric behavior in metal-doped aluminum nitride: an in-depth review

Figure 13. Dependence of the piezoelectric coefficient d33 on Ge concentration in GexAl1-xN thin films. (Reproduced from Ref.[95]).

Microstructures
ISSN 2770-2995 (Online)
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