fig5

Figure 5. (A) Scanning electron microscopy (SEM) image depiction of a biasing chip connected to a TEM lamella prepared using FIB for conducting in situ electrical measurements. The accompanying HAADF-STEM image along with an EDX mapping showcases the initial microstructure. Acquisition of variable J-V curves through TEM observation, coupled with HAADF images, demonstrates the morphological evolution at different electrical biases. Reproduced with the permission of Ref.^[112] Copyright © 2016 American Chemical Society; (B) HAADF-STEM, Bright Field TEM (BFTEM), and SAED were employed for the real-time monitoring of the morphology and structural variations of MAPbI₃ under in situ electrical bias. Reproduced with the permission of Ref.^[114] Copyright © 2018 Wiley-VCH; (C) A diagram illustrating the arrangement of the in situ TEM sample with an applied electrical bias, accompanied by an SEM image of the nano-solar cell lamella prepared using FIB. The scale bar represents 2 μm. Sequential HRTEM images of perovskite subjected to an electrical bias of 1 V. Reproduced with the permission of Ref.^[115] Copyright © 2021 American Chemical Society. EDX: Energy dispersive X-ray; TEM: Transmission electron microscopy; FIB: Focused ion beam; HRTEM :High-resolution TEM; HAADF-STEM: High angle angular dark field-scanning transmission electron microscopy.