fig3

Figure 3. (A) TEM images of P2/O3-Com₉₅₀ 0.8 materials with the insert of SEAD image and partly enlarged graphic and SEM images of P2/O3-Com₉₅₀ 0.8 materials (Reproduced with permission from Ref.^[66]. Copyright 2024, Elsevier); (B) XRD patterns of Na_0.8Mn_yNi_0.8-yFe_0.1Ti_0.1O₂ (y = 0.6, 0.55, 0.5, 0.45) with the inset showing a magnified range (from 15° to 18°) corresponding to the (002) and (003) peaks of the P2 and O3 structures, respectively (Reproduced with permission from Ref.^[77]. Copyright 2024, Elsevier); (C) XRD profiles of as-prepared layered oxides: P2-NCNFM and O3-NCNFM (Reproduced with permission from Ref.^[79]. Copyright 2024, Elsevier); (D) The lines connecting the points in correspond to a spline fitted to the calculated CI-NEB energies (Reproduced with permission from Ref.^[55]. Copyright 2024, John Wiley and Sons); (E) The corresponding migration energy barriers for Na-ion diffusion using NEB calculations (Reproduced with permission from Ref.^[80]. Copyright 2024, Elsevier).