fig2

Figure 2. Probing ferroelectricity with a single-spin scanning sensor and resonant X-ray diffraction. (A) Schematization of the scanning NV electrometer, (B) Plot of the electric field reconstructed after scanning a poled region in a Pb[Zr_0.2Ti_0.8]O₃ thin films, (C) Reconstructed surface charge density revealed the poled domain, (D) corresponding PFM image. Reprinted with permission from Huxter et al. Copyright 2023 by the Authors under Creative Commons Attribution 4.0 International License, published by the Nature Publishing Group^[19]. (E) Schematic representation of the REXS experiment in reflection geometry on a BFO thin epitaxial layer hosting a ferroelectric stripe pattern. (F) Circular dichroism of the diffraction pattern (inset) at the O K edge. (G) Sketch of the ferroelectric texture (domains and domain walls), which can lead to the observed circular dichroism of the diffraction pattern. (E-G) are reprinted with permission from Chauleau et al. Copyright 2020 by the Nature Publishing Group^[9].