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From:  What lies beneath? Investigations of atomic force microscopy-based nano-machining to reveal sub-surface ferroelectric domain configurations in ultrathin films
What lies beneath? Investigations of atomic force microscopy-based nano-machining to reveal sub-surface ferroelectric domain configurations in ultrathin films

Figure 4. Representative topography and lateral (lat) DART-PFM phase and amplitude (amp) images of 5.6 nm (1 u.c.) B6TFMO on NGO (001) as a function of AFM-based nano-machined depth. The scanning direction of the cantilever scanning direction was parallel with the [100]substrate axis.

Microstructures
ISSN 2770-2995 (Online)
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