fig4

Figure 4. (A) Contour plot of the SXRD intensity for TECM compound. (B) Full profile Rietveld refinements of the SXRD patterns for the TECM compound at 100 K and 275 K. (The illustration shows the enlarged area. The experimental profiles are shown by star markers. Bragg reflections are indicated by ticks. Pink lines represent the calculated data, while black lines represent the difference between the observed and calculated data.) (C) Temperature dependence of the lattice parameters a, c, and V of TECM measured by SXRD. (The amounts of $$\sqrt{2}$$a and c/$$\sqrt{3}$$ (a and c are the lattice parameters of the rhombohedra) are equivalent to the cubic amounts).