fig1
Figure 1. Structural and chemical characterizations. (A) a CIPS-IPS crystal (up) and nano flakes on conductive Au/SiO2/Si substrates(down). (B) crystal structure of IPS (viewed along the b-axis), CIPS and CIPS-IPS heterostructure (viewed along the a-axis), respectively. The blue arrows represent the direction of polarization. (C) Raman spectra of CIPS-IPS and IPS flakes. (D) a representative surface topography of CIPS-IPS nano flake measured by AFM. (E) a representative energy-dispersive x-ray spectrum of the CIPS-IPS crystal. The inset shows the SEM image and corresponding elemental mappings.
