fig1
Figure 1. (A) SEM image of the SiO2 precursor; inset: TEM image of SiO2; Morphology and compositional analysis of the Si/CNFs/C composite: (B and C) SEM images at low and high magnifications; (D and E) TEM images at varying magnifications; (F) Selected area electron diffraction (SAED) pattern; (G) High-resolution TEM (HRTEM) image; (H) Elemental mapping. SEM: Scanning electron microscopy; TEM: transmission electron microscopy.
