fig7

From: Band convergence and defect engineering synergistically revamping the carrier-phonon dynamics in Mg_3-xZn_xSb₂ solid solutions: an experimental and theoretical insights

Band convergence and defect engineering synergistically revamping the carrier-phonon dynamics in Mg<sub>3-x</sub>Zn<sub>x</sub>Sb<sub>2</sub> solid solutions: an experimental and theoretical insights

Figure 7. Microstructural and GPA strain analysis of Ag_0.03Mg_1.77Zn_1.2Sb₂ sample: (A) HR-TEM image with grain boundaries; (B) IFFT pattern with dislocations of 7(C); (C) HR-TEM image with dislocations; (D)HR-TEM with defects (E) IFFT pattern of selected portion with dislocations and stacking faults (F) HR-TEM image with stacking faults (G) HR-TEM image with strain (G1) strain distribution (ε_xy); (H) HR-TEM image with high magnitude strain distribution (H1) high magnitude strain distribution field of 7(H). GPA: Geometric phase analysis; HR-TEM: high-resolution transmission electron microscopy; IFFT: inverse fast fourier transform.