Figure1
Figure 1. (A) HAADF-STEM image of V4C3Tz flakes with lateral size indicated, (B and C) HAADF-STEM images of a V4C3Tz monolayers showing vacancies and a (C) pore, (D and E) SEM images of a V4C3Tz film obtained by vacuum filtration, (F) XRD patterns of V4AlC3 and corresponding etched and delaminated samples. Reprinted from[13], Copyright (2024), with permission from Elsevier.
