fig7

Figure 7. (A) HRTEM image of the Ni-Co-P/NF with a further magnified image in the inset; STEM-EDS elemental mapping of Ni-Co-P/NF; (B) High-resolution XPS spectra of Co 2p; c Ni 2p; d P 2p for the prepared samples; (C) CV profile in 1 M KOH (blue curves) or 1.0 M KOH + 0.005 M N₂H₄ under different cycles of scanning; (D) Stability measurements of Ni-Co-P/NF for HzOR; (E) Electrochemical properties of the HzOR in 1.0 M KOH and 0.1 M N₂H₄ 50% iR-corrected LSV; (F) Raman spectra of Ni-Co-P/NF in 1 M KOH or 1 M KOH + 0.1 M N₂H₄; (G) In situ electrochemical Raman spectra of Ni-Co-P/NF in 1 M KOH or 1 M KOH + 0.1 M N₂H₄ at varied applied potentials and different reaction time intervals under constant 0.2 V; (H) Free energy changes of HzOR in path I at NiCoP(111)/CoP(011) interface, CoP(011) and NiCoP(111) surfaces and the most stable adsorption configuration of the intermediate at NiCoP(111)/CoP(011) interface in the inset and Free energy changes of HzOR in path II at NiCoP(111)/CoP(011) interface with the most stable adsorption configuration of the intermediate^[135]. This figure is quoted with permission from Zhu et al. TEM: Transmission electron microscopy; HRTEM: high-resolution TEM; STEM: scanning transmission electron microscopy; EDS: energy-dispersive X-ray spectroscopy; XPS: X-ray photoelectron spectroscopy; CV: cyclic voltammetry; LSV: linear sweep voltammetry.