fig9
Figure 9. X-ray diffractograms of samples produced at different stages of a one-step annealing process from Ge-free and Ge-doped bronze-based precursors. All diffractograms are normalized to Mo reflection peak at 40.5°. Under the measured diffractograms, the patterns of different phases observed during the formation are listed and the numbers behind each phase correspond to reference patterns in ICDD database. ICDD: International centre for diffraction data.
