fig2

Figure 2. Cross-sectional SEM images and their corresponding Zn, Cu, Sn, and Mo EDX elemental maps of (A) an elemental metallic stack precursor and (B) a bronze-based precursor. From the EDX maps, line profiles of the intensity of each element along the depth of the precursor are obtained; For the elemental metallic stack precursor (C), two profiles are obtained: one from a region where the Sn layer is thinner (L1) and one from a region where this layer is thicker (L2); For the bronze-based precursor (D), only one profile is obtained due to the high lateral homogeneity, which is the average along all the width of the sample. SEM: Scanning electron microscopy; EDX: energy-dispersive X-ray spectroscopy.