fig1

Figure 1. Cross-sectional SEM image of the representative stack structure of CZTSe-based devices studied in this work. Each layer of the stack is identified. SEM: Scanning electron microscopy; CZTSe: Cu2ZnSnSe4.
Figure 1. Cross-sectional SEM image of the representative stack structure of CZTSe-based devices studied in this work. Each layer of the stack is identified. SEM: Scanning electron microscopy; CZTSe: Cu2ZnSnSe4.
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