fig2
Figure 2. XRD patterns of the undoped and Ti-doped hematite NWs, subjected to one-step (600 °C) and two-step (800 °C) annealing processes. The α-Fe2O3 reference pattern (JCPDS 33-0664), and the diffractogram corresponding to the FTO substrate are also shown. XRD: X-ray diffraction; NWs: nanowires; FTO: fluorine-doped tin oxide.
