Topic: Recent Advances in Microstructure Characterization by Transmission Electron Microscopy

Building a bridge between properties and structures has always been the key focus of materials research. Transmission electron microscopy is a powerful tool for characterizing the atomic structure in real space, especially the aperiodic and local atomic configurations, including interfaces, boundaries, and other defects. With the development of hardware and software, quantitative atomic structure information with picometer precision become routinely available. Advanced imaging and in-situ techniques are also introduced to extend the scope of electron microscopy, which significantly deepen our understanding of the structure-property relationships of materials. Here, we propose a Special Issue in Microstructures focusing on recent advances in microstructure characterization techniques and their applications in materials research. Contributions in the form of review articles and research papers are all welcome, and the topics will include, but are not limited to, the following:

● Recent advances in transmission electron microscopy; 

● Materials structural characterization using state-of-the-art microscopy techniques;

● In-situ microstructure characterization under external stimuli.