fig7

Figure 7. Mechanically exfoliated 2D MoS₂ on 300 nm SiO₂/Si: optical microscopy (A_1-4). AFM images (A_5-8)^[49]. Optical micrograph of a typical MoS₂ device (B₁). Schematic of a single-layer MoS₂ field-effect transistor (B₂). Raman spectrum (B₃). Thickness scan of single-layer MoS₂ (inset: AFM image) (B₄)^[51].