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Figure 4. HAADF-STEM images of the reduced 1.8%Ni/SAG-11 and the corresponding STEM-mapping mapping images for Ni, Al, O, P, and Si elements. HAADF-STEM: High-angle annular dark-field scanning TEM; TEM: transmission electron microscopy.
Figure 4. HAADF-STEM images of the reduced 1.8%Ni/SAG-11 and the corresponding STEM-mapping mapping images for Ni, Al, O, P, and Si elements. HAADF-STEM: High-angle annular dark-field scanning TEM; TEM: transmission electron microscopy.
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